Highly Accurate Refractometer
The combination of new measuring principle - Pupil Zone Imaging Method - and unique technology - SLD - offers high accuracy and reliability in refraction measurement.
Pupil Zone Imaging Method
The NIDEK ARK-530A / 510A adopts the advanced Pupil Zone Imaging Method for refraction measurement, which analyzes a wider area (Max. o4 mm) to obtain more reliable and realistic data that is closer to subjective refraction.
SLD (Super Luminescent Diode)
The ARK-530A / 510A uses the SLD (Super Luminescent Diode) and highly sensitive CCD device for improved image quality. The image with the SLD is sharper and clearer than those with the LED, and the system offers greatly improved measurement capability even with dense cataract and IOL implanted eyes.
Comparison of image on CCD* *In-house trial data (Model eye)
LED (Normal Eye)
SLD (Normal Eye)
LED (Cataract Eye)
SLD (Cataract Eye)
Reliable Keratometer
The ARK-530A/510A provides ordinary measurement (o3.3 mm) using a mire ring, and also peripheral measurement (o6 mm) using 4 points, both of which offer reliable and accurate keratometry data. The ARK-530A / 510A uses double mire rings for better alignment and observation.
Wide Measurement Range: -30 to +25D
Smallest Measurable Pupil Size: o2mm
Informative 5.7-inch Tiltable Color LCD
3D* Auto Tracking & Auto Shooting *3D: ARK-530A only
High Speed Printer with Easy Loading & Auto Cutter